Monitoring of Optical Emission from High Temperature Plasma Based on Chromatic Modulation
Creators
- 1. Technical and Educational Institute of West Macedonia, Department of Applied Informatics in Business and Economy, Grevena, 51100 (Greece)
Description
An integrated experimental approach is presented for processing the optical emission produced from electric arc plasma. The method is based on chromatic modulation techniques to provide a holistic measurement of the persistence of particle decays within the environment of high power circuit breakers. Chromaticity changes in a number of chromatic parameters are related to changes in physical electric arc plasma environment (e.g. particle concentration). The results are in the form of chromatic maps which show how the overall electric arc plasma and its environment behave and respond. Such maps show the totality of information which can be accessed about the arcing event and the level of monitoring discrimination which is achievable with the chromatic methodology in a simple and easy to understand manner. The suggested method provides easier data analysis and high levels of data compression.
Additional details
Identifiers
- DOI
- 10.1063/1.3225286;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1148
- Journal Issue
- 1
- Journal Page Range
- p. 246-249
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- International conference on computational methods in sciences and engineering 2008
- Acronym
- ICCMSE 2008
- Dates
- 25-30 Sep 2008
- Place
- Hersonissos, Crete (Greece)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41060530
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; COMPRESSION; DATA ANALYSIS; DATA PROCESSING; ELECTRIC ARCS; EMISSION SPECTRA; EMISSION SPECTROSCOPY; HOT PLASMA; MODULATION; PHOTON EMISSION; PLASMA DIAGNOSTICS
- Descriptors DEC
- CURRENTS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; EMISSION; PLASMA; PROCESSING; SEMICONDUCTOR DEVICES; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- (c) 2009 American Institute of Physics