Published August 13, 2009 | Version v1
Journal article

Monitoring of Optical Emission from High Temperature Plasma Based on Chromatic Modulation

  • 1. Technical and Educational Institute of West Macedonia, Department of Applied Informatics in Business and Economy, Grevena, 51100 (Greece)

Description

An integrated experimental approach is presented for processing the optical emission produced from electric arc plasma. The method is based on chromatic modulation techniques to provide a holistic measurement of the persistence of particle decays within the environment of high power circuit breakers. Chromaticity changes in a number of chromatic parameters are related to changes in physical electric arc plasma environment (e.g. particle concentration). The results are in the form of chromatic maps which show how the overall electric arc plasma and its environment behave and respond. Such maps show the totality of information which can be accessed about the arcing event and the level of monitoring discrimination which is achievable with the chromatic methodology in a simple and easy to understand manner. The suggested method provides easier data analysis and high levels of data compression.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1148
Journal Issue
1
Journal Page Range
p. 246-249
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
International conference on computational methods in sciences and engineering 2008
Acronym
ICCMSE 2008
Dates
25-30 Sep 2008
Place
Hersonissos, Crete (Greece)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41060530
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S97: MATHEMATICAL METHODS AND COMPUTING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE-COUPLED DEVICES; COMPRESSION; DATA ANALYSIS; DATA PROCESSING; ELECTRIC ARCS; EMISSION SPECTRA; EMISSION SPECTROSCOPY; HOT PLASMA; MODULATION; PHOTON EMISSION; PLASMA DIAGNOSTICS
Descriptors DEC
CURRENTS; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; EMISSION; PLASMA; PROCESSING; SEMICONDUCTOR DEVICES; SPECTRA; SPECTROSCOPY

Optional Information

Notes
(c) 2009 American Institute of Physics