Published April 14, 2014 | Version v1
Journal article

Optical and electrical stability of viral-templated copper sulfide (Cu1.8S) films

  • 1. Department of Electrical Engineering, University of California, Riverside, California 92521 (United States)
  • 2. Materials Science and Engineering Program, University of California, Riverside, California 92521 (United States)

Description

The optical and electrical stabilities of viral-templated non-stoichiometric copper sulfide, digenite (Cu1.8S) films were investigated. The films were composed of large agglomerates of randomly aligned Cu1.8S-coated M13 filamentous phage. Free carrier optical absorption associated with localized surface plasmon resonance (LSPR) was observed in the near infrared spectral region, and the films were electrically active, displaying a linear current-voltage relationship. Under ambient conditions, the magnitude of the LSPR absorption increased, following a power law relationship with time, and the electrical resistance of viral-templated films decreased significantly. In contrast, the resistance of films stored under low oxygen, low humidity conditions experienced a smaller reduction in electrical resistance. Changes in optical and electrical film properties under ambient conditions were associated with an increase in free carrier concentration within the copper chalcogenide material due to oxygen exposure. X-ray photoelectron spectroscopy was used to relate this increase in free carrier concentration to compositional changes on the viral-templated material surface

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
115
Journal Issue
14
Journal Page Range
p. 144311-144311.8
ISSN
0021-8979
CODEN
JAPIAU

Optional Information

Notes
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