Studies of subnanosecond x-ray switching and shuttering techniques
Creators
- 1. Rochester Univ., NY (USA). Lab. for Laser Energetics
- 2. Los Alamos National Lab., NM (USA)
- 3. Lawrence Livermore National Lab., CA (USA)
Description
This paper discusses experimental studies conducted of the changes in x-ray diffraction properties of crystals under intense subnanosecond laser heating. One beam of the PHOENIX laser system was used to create an intense source of x-ray line radiation. This radiation was in turn diffracted from a silicon crystal that was heated with the other beam of the laser. The diffracted radiation was temporally resolved with an x-ray streak camera. The diffracted lines are observed to broaden spectrally on a subnanosecond time scale. From the temporal structure of the diffrated radiation, information is derived on the nature of the laser heating process. Interruption of crystal diffraction on a subnanosecond time scale is potentially useful as mechanism for x-ray switching and shuttering. Considerations for the design and construction of such devices are discussed
Additional details
Publishing Information
- Publisher
- Princeton Plasma Physics Laboratory.
- Imprint Place
- Princeton, NJ (USA)
- Imprint Title
- Proceedings of the 6th topical conference on high temperature plasma diagnostics
- Imprint Pagination
- 92 p.
- Journal Page Range
- p. N16.
Conference
- Title
- 6. topical conference on high temperature plasma diagnostics.
- Dates
- 9-13 Mar 1986.
- Place
- Hilton Head Island, SC (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22000754
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CRYSTAL LATTICES; EXPERIMENTAL DATA; LASER-PRODUCED PLASMA; LASER-RADIATION HEATING; LINE BROADENING; PLASMA DIAGNOSTICS; SILICON; SPECIFICATIONS; STREAK CAMERAS; X-RAY DIFFRACTION
- Descriptors DEC
- CAMERAS; COHERENT SCATTERING; CRYSTAL STRUCTURE; DATA; DIFFRACTION; ELEMENTS; HEATING; INFORMATION; NUMERICAL DATA; PLASMA; PLASMA HEATING; SCATTERING; SEMIMETALS
Optional Information
- Secondary number(s)
- CONF-860324--.