Testing of single-layer materials and products by neutron backscattering method

Results of calculational and experimental investigations of neutron backscattering (albedo) from single-layer barriers, effect of local inhomogeneity in the barrier and behind the barrier in the field of backscattered neutrons are considered. Calculational and experimental values of sensitivity in thickness gauging and defectoscopy of single-layer items under conditions of one-side access are given. Possibility for revealing local inhomogeneities (defects) by means of backscattered neutrons of a material with low atomic number and density, located behind metal screens of large thickness, is shown. Extremely high sensitivity of the method to the presence of defect behind the screen permits to detect it not only at its location directly behind the screen but at comparatively large distances behind the screen (up to 200 mm). Solution of similar problems in case of one-side access to an object is not possible by any other radiation and nonradiation methods