Published December 2013
| Version v1
Miscellaneous
High-frequency dielectric measurements of TIIn1-xErxSe2 crystals
- 1. ANAS? Institute of Physics, Baku (Azerbaijan)
Description
The purpose of this work is to study the dielectric properties of TIInSe2 and TIInSe2-Er single crystals in alternating electric fields, definition of the main dielectric coefficients and to establish the nature of dielectric losses. It was conducted dielectric measurements of a TIInSe2 single crystal in the frequency range 5*104 - 3.5*107 Hz, which allowed to detect the nature of relaxation dispersion of the dielectric constant and dielectric losses in the nature of a single crystal. The effect of partial substitution of indium in TIInSe2-Er by erbium on electrical and dielectric properties of the crystals was studied
Availability note (English)
Available from the Institute of Radiation Problems, Baku (AZ)Additional details
Additional titles
- Original title (Russian)
- Высокочастотные диелектрические измерения кристаллов TIIn<суб>1</суб>-xер<суб>x</суб>Се<суб>2</суб>
Publishing Information
- Publisher
- The printing house of Sumgayit State University
- Imprint Place
- Sumgayit (Azerbaijan)
- Imprint Title
- Microelectronic converters and devices based on them. Materials of the seventh international scientific and technical conference. Devoted to 90th aniversary of Haydar Aliyev
- Imprint Pagination
- 216 p.
- Journal Page Range
- p. 144-147
Conference
- Title
- 7. international scientific and technical conference on microelectronic converters and devices based on them
- Dates
- 27-29 Nov 2013
- Place
- Sumgayit (Azerbaijan)
INIS
- Country of Publication
- Azerbaijan
- Country of Input or Organization
- Azerbaijan
- INIS RN
- 46105624
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature, Numerical Data
- Descriptors DEI
- CRYSTALS; DATA ANALYSIS; DIELECTRIC PROPERTIES; ELECTRICAL SURVEYS; ELECTROMAGNETIC FIELDS; ERBIUM; EVALUATED DATA; FREQUENCY ANALYSIS; FREQUENCY RANGE; INDIUM; INFRARED RADIATION; POLARIZATION; RELAXATION; SAMPLE PREPARATION; SENSITIVITY ANALYSIS
- Descriptors DEC
- DATA; DATA PROCESSING; ELECTRICAL PROPERTIES; ELECTROMAGNETIC RADIATION; ELEMENTS; GEOLOGIC SURVEYS; GEOPHYSICAL SURVEYS; INFORMATION; METALS; NUMERICAL DATA; PHYSICAL PROPERTIES; PROCESSING; RADIATIONS; RARE EARTHS
Optional Information
- Notes
- 4 figs; 5 refs Imprint:Mikroelektronnye preobrazovateli i pribory na ix osnove. Materialy sedmoy mejdunarodnoy nauchno-texnicheskoy konferentsii. Posvashaetsa 90letiyu Geydara Aliyeva
- Secondary number(s)
- SEC--4