Published November 12, 1984 | Version v1
Journal article

The electron screening effect in muonic 28Si

  • 1. Eidgenoessische Technische Hochschule, Zurich (Switzerland). Inst. fuer Mittelenergiephysik
  • 2. Fribourg Univ. (Switzerland). Inst. de Physique

Description

We have measured the wavelengths of the 4fsub(7/2)-3dsub(5/2) and the 4fsub(5/2)-3dsub(3/2) X-ray transitions in μ-28Si with the bent-crystal spectrometer at the SIN muon channel. The results are compared to the calculated transition wavelengths which include radiative corrections (QED). The differences in the corresponding transition energies are attributed to the electron screening shift. Combining the results from both transitions, we obtain ΔEsub(ES)(4f-3d) = -1.66 +- 0.20 eV. This corresponds to (83 +- 11)% of the electron-screening shift calculated for a neutral atom with the muon and Z - 1 electrons. These results are in moderate agreement with cascade calculations constrained to reproduce measured muonic X-ray intensities. (orig.)

Additional details

Publishing Information

Journal Title
Nucl. Phys., A
Journal Volume
429
Journal Issue
3
Series
CODEN: NUPAB.;Nucl. Phys., A.
Journal Page Range
381-388
ISSN
0375-9474

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
16011610
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
EXPERIMENTAL DATA; MUONIC ATOMS; SILICON; SILICON 28; SPECTRAL SHIFT; X-RAY SPECTRA
Descriptors DEC
ATOMS; DATA; ELEMENTS; EVEN-EVEN NUCLEI; HADRONIC ATOMS; INFORMATION; ISOTOPES; LIGHT NUCLEI; MESIC ATOMS; NUCLEI; NUMERICAL DATA; SEMIMETALS; SILICON ISOTOPES; SPECTRA; STABLE ISOTOPES