Published April 1, 2006 | Version v1
Journal article

A novel and simple fabrication method of embedded SU-8 micro channels by direct UV lithography

  • 1. National Synchrotron Radiation Research Center (NSRRC) No. 101, Kuang-Fu Rd., Sec., Hsinchu 300, Taiwan (China)
  • 2. Institute of MEMS, National Tsing-Hua University, Taiwan (China)

Description

In this paper, we presents a novel and simple method to fabricate embedded micro channels. The method based on different light absorption properties of the SU-8 thick photoresist under different incident UV wavelengths. The channel structures are defined by the ordinary I-line, while the cover layer is patterned by the deep UV. Because the deep UV is obtained directly on the same aligner with a set of filter mirrors, the embedded channel can be easily produced without other rare facilities. Besides, the relationship between the thickness of the top layer and the exposure dose of the deep UV has been measured by an ingeniously designed experiment. The specific thickness of the top layer of the embedded micro channel can then be secured by the specific deep-UV exposure dose. Further more, many meaningful mechanical structures have been realized by this method, the material property of the top layer are also measured

Availability note (English)

Available online at http://stacks.iop.org/1742-6596/34/330/jpconf6_34_054.pdf or at the Web site for the Journal of Physics. Conference Series (Online) (ISSN 1742-6596) http://www.iop.org/

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
34
Journal Issue
1
Journal Page Range
p. 330-335
ISSN
1742-6596

Conference

Title
International MEMS conference 2006
Acronym
iMEMS2006
Dates
9-12 May 2006
Place
Singapore (Singapore)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37058529
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; FABRICATION; FILTERS; LAYERS; MASKING; MECHANICAL STRUCTURES; MICROSTRUCTURE; MIRRORS; THICKNESS; ULTRAVIOLET RADIATION; VISIBLE RADIATION; WAVELENGTHS
Descriptors DEC
DIMENSIONS; ELECTROMAGNETIC RADIATION; RADIATIONS; SORPTION