Published 2021 | Version v1
Book Metadata-only

Determination of crystallographic planes for a polyhedral single crystal

Creators

  • 1. Comprehensive Research Organization for Science and Society (CROSS), Neutron Science and Technology Center, Tokai, Ibaraki (Japan)
  • 2. Hiroshima University, Graduate School of Advanced Sciences of Matter, Department of Quantum Matter, Higashi-Hiroshima, Hiroshima (Japan)
  • 3. Nagoya Institute of Technology, Graduate School of Engineering, Department of Physical Science and Engineering, Nagoya, Aichi (Japan)
  • 4. Japan Atomic Energy Agency (JAEA), J-PARC Center, Tokai, Ibaraki (Japan)

Description

Crystal and magnetic structure analyses of single crystals with large neutron absorption cross sections using SENJU require intensity data that adequately correct absorption effects. To perform numerical absorption correction based on the crystal shape, a procedure was developed in this study to determine the Miller indices of polyhedral crystal faces using the photographs of crystals taken with a CCD camera and the UB matrix obtained using SENJU. Structural analysis of DyNi3Al9 demonstrated that the absorption effect could be corrected. (author)

Availability note (English)

Available from DOI: https://doi.org/10.7566/JPSCP.33.011067
Part of:
Proceedings of the 3rd J-PARC Symposium (J-PARC2019)

Additional details

Identifiers

DOI
10.7566/JPSCP.33.011067;

Publishing Information

Publisher
Physical Society of Japan
Imprint Place
Tokyo (Japan)
ISBN
978-4-89027-146-7
Imprint Title
Proceedings of the 3rd J-PARC Symposium (J-PARC2019)
Imprint Pagination
[934 p.]
Journal Page Range
p. 011067.1-011067.6

Conference

Title
3. J-PARC symposium
Acronym
J-PARC2019
Dates
23-27 Sep 2019
Place
Tsukuba, Ibaraki (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
53056391
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; ACCELERATOR EXPERIMENTAL FACILITIES; ANISOTROPY; CHARGE-COUPLED DEVICES; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DYSPROSIUM COMPOUNDS; J-PARC; LAUE METHOD; LORENTZ TRANSFORMATIONS; NEUTRON DIFFRACTION; NEUTRON DIFFRACTOMETERS; TIME-OF-FLIGHT METHOD; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIFFRACTION METHODS; DIFFRACTOMETERS; MEASURING INSTRUMENTS; RARE EARTH COMPOUNDS; SCATTERING; SEMICONDUCTOR DEVICES; SORPTION; TRANSFORMATIONS

Optional Information

Notes
14 refs., 5 figs., 1 tab.