Published December 15, 1972 | Version v1
Journal article

Beam profile measuring device and focusing aid

Creators

  • 1. Brookhaven National Lab., Upton, N.Y. (USA)

Description

no abstract available

Additional details

Identifiers

Publishing Information

Journal Title
Nuclear Instruments and Methods
Journal Volume
105
Journal Issue
3
Series
Nucl. Instrum. Methods.
Journal Page Range
603-604
ISSN
0029-554X

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
4071556
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
APERTURES; BEAM MONITORING; BEAM PROFILES; FOCUSING; MILLI AMP BEAM CURRENTS; PLATES; TANTALUM
Descriptors DEC
BEAM CURRENTS; CURRENTS; ELEMENTS; METALS; MONITORING; OPENINGS; TRANSITION ELEMENTS

Optional Information

Notes
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