Structural investigation of the LaAlO3(110) surface
- 1. Laboratoire de Physique et de Spectroscopie Electronique, UMR 7014 CNRS-UHA, Faculte des Sciences et Techniques, 4 rue des Freres Lumiere, 68093 MULHOUSE Cedex (France)
Description
Chemical and structural characterizations of the LaAlO3(110) surface was investigated by XPS, XPD, LEED and RHEED. The atomic structure of this ternary alloy, can be viewed as a superposition of LaO and AlO2 planes in the [001] direction. For clean substrates, a c(4 x 2) surface reconstruction was pointed out by RHEED and LEED. Polar X-ray photoelectron diffraction investigations made in the [- 110] azimuthal direction, for La3d, O1s and Al2score levels reveal well structured diagrams reflecting the atomic distribution of the two kinds of parallel planes in the [- 110] direction and perpendicular to the (110) surface. The main crystallographic directions give strong forward-scattering peaks at 0o, 35o and 54.7o corresponding to the [110], [111] and [112] directions respectively
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2008.08.140Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2008.08.140;
- PII
- S0040-6090(08)00916-4;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 517
- Journal Issue
- 1
- Journal Page Range
- p. 441-443
- ISSN
- 0040-6090
- CODEN
- THSFAP
Conference
- Title
- 5. International conference on silicon epitaxy and heterostructures
- Acronym
- ICSI-5
- Dates
- 20-24 May 2007
- Place
- Marseille (France)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40059043
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINATES; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; LANTHANUM OXIDES; SURFACES; TERNARY ALLOY SYSTEMS; X RADIATION; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- ALLOY SYSTEMS; ALUMINIUM COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON SPECTROSCOPY; IONIZING RADIATIONS; LANTHANUM COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; RADIATIONS; RARE EARTH COMPOUNDS; SCATTERING; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.