Published April 1, 2010
| Version v1
Journal article
Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique
Creators
- 1. Department of Mechanical Engineering, Northwestern University, Evanston, IL 60208 (United States)
- 2. School of Applied Physics, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor (Malaysia)
- 3. Department of Electrical and Computer Engineering, Texas A and M University, College Station, TX 77483 (United States)
- 4. Department of Physics, Texas A and M University, College Station, TX 77843 (United States)
Description
The thermal diffusivity of YBa2Cu3O7-x (YBCO) film was measured using the optical pump-probe method. A theoretical finite-difference model was employed to calculate the diffusivity value, and the best fit for the c-axis oriented YBCO film showed an average thermal diffusivity of 0.25 ± 0.05 mm2 s-1. The obtained result is compared to previous reports measured using various methods.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2010.02.016Additional details
Identifiers
- DOI
- 10.1016/j.physc.2010.02.016;
- PII
- S0921-4534(10)00117-6;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 470
- Journal Issue
- 7-8
- Journal Page Range
- p. 365-368
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41089886
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BARIUM COMPOUNDS; COPPER COMPOUNDS; CUPRATES; HIGH-TC SUPERCONDUCTORS; OXYGEN COMPOUNDS; SULFUR IONS; THERMAL DIFFUSIVITY; THIN FILMS; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHARGED PARTICLES; COPPER COMPOUNDS; FILMS; IONS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SUPERCONDUCTORS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS; TYPE-II SUPERCONDUCTORS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.