Published April 1, 2010 | Version v1
Journal article

Thermal diffusivity measurement of YBa2Cu3O7-x thin film with a picosecond thermoreflectance technique

  • 1. Department of Mechanical Engineering, Northwestern University, Evanston, IL 60208 (United States)
  • 2. School of Applied Physics, Universiti Kebangsaan Malaysia, 43600 Bangi, Selangor (Malaysia)
  • 3. Department of Electrical and Computer Engineering, Texas A and M University, College Station, TX 77483 (United States)
  • 4. Department of Physics, Texas A and M University, College Station, TX 77843 (United States)

Description

The thermal diffusivity of YBa2Cu3O7-x (YBCO) film was measured using the optical pump-probe method. A theoretical finite-difference model was employed to calculate the diffusivity value, and the best fit for the c-axis oriented YBCO film showed an average thermal diffusivity of 0.25 ± 0.05 mm2 s-1. The obtained result is compared to previous reports measured using various methods.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2010.02.016

Additional details

Identifiers

DOI
10.1016/j.physc.2010.02.016;
PII
S0921-4534(10)00117-6;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
470
Journal Issue
7-8
Journal Page Range
p. 365-368
ISSN
0921-4534
CODEN
PHYCE6

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.