Published May 2000
| Version v1
Journal article
XRF studies on intensity variation of element oxides of rock samples under thermal treatment
Creators
- 1. Sophisticated Instrument Facility, Univ. of Science Instrumentation Centre, Gauhati Univ., Guwahati (India)
- 2. Dept. of Physics, Gauhati Univ., Guwahati (India)
Description
Silicate rock samples are made fine grained powder (100 mesh) in a Fritsch pulveriser pellets of samples are made by applying a load of 225 kN. International standard silicate rock samples supplied by Geostandards, France, are used to get standard set of curves and regression ion lines for each element/ element oxides in terms of percentage of major and minor element oxides. Analysis is done in a Philips PW 1480 computerised XRF spectrometer using X40 software
Additional details
Publishing Information
- Journal Title
- Indian Journal of Physics. Part A
- Journal Volume
- 74
- Journal Issue
- 3
- Journal Page Range
- p. 251-253
- CODEN
- INJADP
Conference
- Title
- national conference on thermophysical properties of solid and fluids
- Acronym
- NCTP
- Dates
- 11-13 Mar 1999
- Place
- Guwahati (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 31061390
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- LITHIUM CARBONATES; LITHIUM OXIDES; REGRESSION ANALYSIS; ROCKS; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CARBON COMPOUNDS; CARBONATES; CHALCOGENIDES; CHEMICAL ANALYSIS; LITHIUM COMPOUNDS; MATHEMATICS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; STATISTICS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 10 refs., 2 figs., 1 tab.