Performance degradation of Geiger-mode APDs at cryogenic temperatures

Two-phase Cryogenic Avalanche Detectors (CRADs) with THGEM multipliers, optically read out with Geiger-mode APDs (GAPDs), were proposed as potential technique for charge recording in rare-event experiments. In this work we report on the degradation of the GAPD performance at cryogenic temperatures revealed in the course of the study of two-phase CRAD in Ar, with combined THGEM/GAPD-matrix multiplier; the GAPDs recorded secondary scintillation photons from the THGEM holes in the Near Infrared. The degradation effect, namely the loss of the GAPD pulse amplitude, depended on the incident X-ray photon flux. The critical counting rate of photoelectrons produced at the 4.4 mm² GAPD, degrading its performance at 87 K, was estimated as ∼ 10⁴ s⁻¹. This effect was shown to result from the considerable increase of the pixel quenching resistor of this CPTA-made GAPD type. Though not affecting low-rate rare-event experiments, the observed effect may impose some limitations on the performance of CRADs with GAPD-based optical readout at higher-rate applications