Published October 2007 | Version v1
Journal article

Electronic background rejection in a new ultra-low background alpha-particle counter

  • 1. XIA LLC, 8450 Central Avenue, Newark, CA 94560 (United States)

Description

Low background alpha-particle (α) counting is required in the semiconductor industry, where α's produce single event errors. Industry road maps call for measuring α emissivities at 0.0005 α/cm2/h, while current commercial counter backgrounds are 0.005 α/cm2/h, a factor of 10 too high. This paper shows that by designing an ionization chamber so that ionization tracks collected from the sample have long risetimes while those collected from the anode have short risetimes, signal risetime analysis can distinguish α emanation location within the counter. Coupled with a guard electrode to reject tracks emitted from the counter sidewalls, the method can achieve backgrounds approaching 0.0001 α/cm2/h, a factor of 20 lower

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nimb.2007.04.089

Additional details

Identifiers

DOI
10.1016/j.nimb.2007.04.089;
PII
S0168-583X(07)00873-7;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
263
Journal Issue
1
Journal Page Range
p. 221-224
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
6. topical meeting on industrial radiation and radioisotope measurement applications
Dates
20-24 Jun 2005
Place
Hamilton, ON (Canada)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39049207
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALPHA PARTICLES; ANODES; EMISSIVITY; ERRORS; IONIZATION; IONIZATION CHAMBERS; MAPS; PARTICLE TRACKS; SEMICONDUCTOR MATERIALS; SIGNALS
Descriptors DEC
CHARGED PARTICLES; ELECTRODES; IONIZING RADIATIONS; MATERIALS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATIONS; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.