Published October 2007
| Version v1
Journal article
Electronic background rejection in a new ultra-low background alpha-particle counter
Creators
- 1. XIA LLC, 8450 Central Avenue, Newark, CA 94560 (United States)
Description
Low background alpha-particle (α) counting is required in the semiconductor industry, where α's produce single event errors. Industry road maps call for measuring α emissivities at 0.0005 α/cm2/h, while current commercial counter backgrounds are 0.005 α/cm2/h, a factor of 10 too high. This paper shows that by designing an ionization chamber so that ionization tracks collected from the sample have long risetimes while those collected from the anode have short risetimes, signal risetime analysis can distinguish α emanation location within the counter. Coupled with a guard electrode to reject tracks emitted from the counter sidewalls, the method can achieve backgrounds approaching 0.0001 α/cm2/h, a factor of 20 lower
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2007.04.089Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2007.04.089;
- PII
- S0168-583X(07)00873-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 263
- Journal Issue
- 1
- Journal Page Range
- p. 221-224
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 6. topical meeting on industrial radiation and radioisotope measurement applications
- Dates
- 20-24 Jun 2005
- Place
- Hamilton, ON (Canada)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39049207
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALPHA PARTICLES; ANODES; EMISSIVITY; ERRORS; IONIZATION; IONIZATION CHAMBERS; MAPS; PARTICLE TRACKS; SEMICONDUCTOR MATERIALS; SIGNALS
- Descriptors DEC
- CHARGED PARTICLES; ELECTRODES; IONIZING RADIATIONS; MATERIALS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; RADIATION DETECTORS; RADIATIONS; SURFACE PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.