Published 1989
| Version v1
Miscellaneous
Bragg-surface multiple diffraction for semiconductor characterization
Creators
- 1. Conselho Nacional de Desenvolvimento Cientifico e Tecnologico, Rio de Janeiro, RJ (Brazil)
Description
Published in summary form only
Availability note (English)
Available from the Library of Comissao Nacional de Energia Nuclear, RJ, Brazil.Additional details
Additional titles
- Original title (Portuguese)
- Difracao multipla Bragg-superficie na caracterizacao de semicondutores
Publishing Information
- Imprint Title
- Proceedings of the 12. National Meeting on Condensed Matter Physics
- Imprint Pagination
- 301 p.
- Journal Page Range
- p. 62.
Conference
- Title
- 12. National Meeting on Condensed Matter Physics.
- Dates
- 9-13 May 1989.
- Place
- Caxambu, MG (Brazil).
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 20070327
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference, No Abstract, Non-conventional Literature
- Descriptors DEI
- EPITAXY; GEOMETRY; INDIUM PHOSPHIDES; LAYERS; MULTIPLE SCATTERING; SEMICONDUCTOR MATERIALS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; INDIUM COMPOUNDS; MATERIALS; MATHEMATICS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; SCATTERING
Optional Information
- Notes
- Imprint:Anais do 12. Encontro Nacional de Fisica da Materia Condensada.