Published 1971
| Version v1
Report
Investigations of ion implantation in silicon using particle channeling
Description
no abstract available
Availability note (English)
MF available from INIS under the Report Number.Additional details
Publishing Information
- Imprint Pagination
- 162 p.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 3028661
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ANNEALING; BACKSCATTERING; CARBON IONS; CRYSTAL LATTICES; DEPTH; DISTRIBUTION; ENERGY; HELIUM IONS; ION CHANNELING; ION IMPLANTATION; MASS; ORDER-DISORDER TRANSFORMATIONS; OXYGEN IONS; RADIATION DOSES; SILICON; TEMPERATURE DEPENDENCE
- Descriptors DEC
- CHANNELING; CHARGED PARTICLES; CRYSTAL STRUCTURE; DIMENSIONS; ELEMENTS; HEAT TREATMENTS; IONS; PHASE TRANSFORMATIONS; SCATTERING; SEMIMETALS
Optional Information
- Notes
- University Microfilms Order No. 72-9628.