Published October 1, 2005 | Version v1
Journal article

Silicon strip detector applied to X-ray diffractometer: Angular resolution and counting rate

  • 1. Faculty of Physics and Applied Computer Science, AGH University of Science and Technology, Al. Mickiewicza 30, 30-059 Cracow (Poland)

Description

The silicon strip detector (128 strips with 100 μm strip pitch) was mounted at the arm of laboratory X-ray diffractometer with 230 mm instrument radius. With the use of a LaB6 standard sample we demonstrate the angular resolution of 0.05 deg at low angles for classical Bragg-Brentano configuration. Experiments with a large LiF single crystal makes it possible to experimentally determine the detector limit range of linearity (30 000 cps/strip) and maximum counting range (100 000 cps/strip)

Additional details

Identifiers

DOI
10.1016/j.nima.2005.07.043;
PII
S0168-9002(05)01482-8;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
551
Journal Issue
1
Journal Page Range
p. 73-77
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
Symposium D, applications of linear and area detectors for X-ray and neutron diffraction and spectroscopy
Acronym
E-MRS fall meeting 2004
Dates
6-10 Sep 2004
Place
Warsaw (Poland)

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.