Published September 30, 2009 | Version v1
Journal article

Modeling the decay of entanglement for electron spin qubits in quantum dots

  • 1. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft (Netherlands)
  • 2. Institut fuer Quantenoptik und Quanteninformation, Oesterreichische Akademie der Wissenschaften, A-6020 Innsbruck (Austria)

Description

We investigate the time evolution of entanglement under various models of decoherence: a general heuristic model based on local relaxation and dephasing times, and two microscopic models describing decoherence of electron spin qubits in quantum dots due to the hyperfine interaction with the nuclei. For each of the decoherence models, we investigate and compare how long the entanglement can be detected. We also introduce filtered witness operators, which extend the available detection time and investigate this detection time for various multipartite entangled states. By comparing the time required for detection with the time required for generation and manipulation of entanglement, we estimate for a range of different entangled states how many qubits can be entangled in a one-dimensional array of electron spin qubits.

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/21/39/395602

Additional details

Identifiers

DOI
10.1088/0953-8984/21/39/395602;
PII
S0953-8984(09)16098-8;

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
21
Journal Issue
39
Journal Page Range
[11 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
41111028
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Descriptors DEI
DETECTION; ELECTRONS; HYPERFINE STRUCTURE; NUCLEI; ONE-DIMENSIONAL CALCULATIONS; QUANTUM DOTS; QUANTUM ENTANGLEMENT; QUBITS; SPIN
Descriptors DEC
ANGULAR MOMENTUM; ELEMENTARY PARTICLES; FERMIONS; INFORMATION; LEPTONS; NANOSTRUCTURES; PARTICLE PROPERTIES; QUANTUM INFORMATION