In situ micropillar compression of Al/SiC nanolaminates using laboratory-based nanoscale X-ray microscopy: Effect of nanopores on mechanical behavior

Highlights: • In situ micropillar compression on Al/SiC nanolaminates was performed using lab-based x-ray microscope with a resolution of 50 nm. • Pores were quantified and their effect on the damage mechanism was studied at nanoscale. • The effect of Ga⁺ milling was compared with Ne⁺ milling by performing compression on micropillars. • Both these sources led to micropillars having the same strength and strain-to-failure. -- Abstract: In situ studies using X-ray tomography have gained immense popularity in the recent past owing to their non-destructive nature and ability to capture the microstructure of a wide range of materials in 3D. In this work, we have conducted in situ micropillar compression and studied damage evolution in Al/SiC nanolaminates using a laboratory-based nanoscale X-ray microscope. Nanoscale defects present in the microstructure were characterized in 3D. The effect of these nanopores on damage initiation was quantified and is discussed. Additionally, the effect of Ga⁺ ion milling on micropillar fabrication was characterized by performing a comparative experiment on pillars fabricated using Ga⁺ and Ne⁺ ion source based focused ion beams.