Published April 19, 2005
| Version v1
Journal article
Control of compound forming reaction at the interface between SnZn solder and Cu substrate
Creators
- 1. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
- 2. Electronics Materials Division, Harima Chemicals Inc., Kakogawa 675-0019 (Japan)
Description
Effects of additives, Cu and Ni, on intermetallic compound formation at the interface between Sn-Zn-based solder and Cu substrate have been studied. (Sn91Zn9)99.98-xM xAl0.02 (wt.%) solder (M = Cu or Ni) alloys were prepared. The microstructures of the samples after annealing at 120 deg. C for 100 h were investigated using a scanning electron microscope, and the melting temperatures of the alloys were measured with a differential scanning calorimeter for different Cu or Ni contents. Although the melting (liquidus) temperature increases up to about 210-220 deg. C by alloying Cu or Ni of 2.6-2.7 wt.% to the solder, the well-known formation of intermetallic compounds, Cu5Zn8 and Sn6Cu5, are found to be significantly restrained
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2004.09.043;
- PII
- S0925-8388(04)01200-9;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 392
- Journal Issue
- 1-2
- Journal Page Range
- p. 200-205
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37052294
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM ALLOYS; ANNEALING; CALORIMETERS; CASTING; COPPER ALLOYS; INTERFACES; INTERMETALLIC COMPOUNDS; MELTING; MELTING POINTS; MICROSTRUCTURE; NICKEL ALLOYS; SCANNING ELECTRON MICROSCOPY; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THERMAL ANALYSIS; TIN ALLOYS; X RADIATION; X-RAY DIFFRACTION; ZINC ALLOYS
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FABRICATION; HEAT TREATMENTS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; RADIATIONS; SCATTERING; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT ALLOYS; TRANSITION TEMPERATURE
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.