Published September 1990
| Version v1
Journal article
Charge incorporation into metal-semiconductor structires surface areas influenced by radiation
Description
Numerical calculation of metal atom penetration into a semiconductor with regard to their precipitation in semicodnuctor vacancies under semultaneous action of γ-radiation and the applied field are the metal contact with the semiconductor of n-type promotes the ion penetration (the barrier is established by Pt sputtering), when acceptor levels in the semiconductor are formed by these ions
Additional details
Additional titles
- Original title (Russian)
- Встраивание заряда в приповерхностных областях структур металл-полупроводник под действием облучения
Publishing Information
- Journal Title
- Radiotekhnika i Ehlektronika
- Journal Volume
- 35
- Journal Issue
- 9
- Series
- Radiotekh. Ehlektron.
- Journal Page Range
- 2006-2009
- ISSN
- 0033-8494
- CODEN
- RAELA
INIS
- Country of Publication
- Russian Federation
- Country of Input or Organization
- USSR
- INIS RN
- 23004179
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BOUNDARY CONDITIONS; DIFFUSION; DISTRIBUTION FUNCTIONS; ELECTRIC FIELDS; GALLIUM ARSENIDES; N-TYPE CONDUCTORS; PHYSICAL RADIATION EFFECTS; PLATINUM; SURFACES; TIME DEPENDENCE
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; ELEMENTS; GALLIUM COMPOUNDS; MATERIALS; METALS; PLATINUM METALS; PNICTIDES; RADIATION EFFECTS; SEMICONDUCTOR MATERIALS; TRANSITION ELEMENTS