Depth profiling with positrons of krypton implanted in molybdenum

A low-energy positron beam has been used to study krypton implanted into polycrystalline molybdenum foil at an energy of 100 keV. The change in the Doppler broadening lineshape parameter, as calculated from the integrated difference spectra of the annihilation lineshapes, has been measured as a function of incident positron energy up to 12 keV. Using a fixed positron stopping profile, a characteristic defect depth of 171 A has been found, in reasonable agreement with the estimated krypton profile. (author)