Published September 2010 | Version v1
Journal article

Complex scattering potential - ionization contribution (CSP-ic) method for calculating total ionization cross sections on electron impact

  • 1. V.P. and R.P.T.P. Science College, Vallabh Vidyanagar, Gujarat (India)
  • 2. Department of Physics, Faculty of Engineering and Technology, CHARUSAT, Gujarat (India)
  • 3. Department of Physics, S.P. University, Vallabh Vidyanagar, Gujarat (India)

Description

In this article, we report calculations of total ionization cross sections, Q(ion), for simple atoms (C, N, O, F) and molecules (NO and NH3) of atmospheric interest on electron impact at energies from threshold to 2000 eV. We have employed the complex scattering potential - ionization contribution (CSP-ic) method for the present study. Attempt has been made to improve the method by computing the parameter that involves the ratio of sum of the total excitation cross sections (ΣQ(exc)) and total inelastic cross section (Q(inel)) at the peak of the inelastic cross section. The present study not only provided a better estimation of the parameter involved in the CSP-ic method but also provided better agreement with the available experimental and theoretical data on the ionization cross sections of the simple atomic and molecular targets studied here. (authors)

Availability note (English)

Available from doi: <http://dx.doi.org/10.1140/epjd/e2010-00140-6

Additional details

Identifiers

Publishing Information

Journal Title
European Physical Journal. D, Atomic, Molecular, Optical and Plasma Physics
Journal Volume
59
Journal Issue
no.3
Journal Page Range
p. 379-387
ISSN
1434-6060

Optional Information

Notes
54 refs.