Published 1993 | Version v1
Journal article Metadata-only

Surface physics studied by means of scanning tunneling microscopy

Creators

  • 1. Institut for Fysik og Astronomi, Aarhus Universitet (Denmark)

Description

Scanning tunneling microscopy has been applied to study silicon crystal structures, oxygen on Cu (110), and real industrial catalyst surfaces. For the latter purpose an Atomic Force Microscope is being developed. (EG)

Additional details

Additional titles

Original title (Danish)
Overfladefysik studeret ved scanning tunneling mikroskopi

Publishing Information

Journal Title
Materialenyt
Journal Issue
no.3
Journal Page Range
p. 12-21.
ISSN
0106-4037
CODEN
MTRYDJ

INIS

Country of Publication
Denmark
Country of Input or Organization
Denmark
INIS RN
25042658
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Descriptors DEI
CATALYSTS; COPPER; MATERIALS TESTING; OXIDATION; SCANNING ELECTRON MICROSCOPY; SILICON; SURFACE PROPERTIES; TUNNEL EFFECT
Descriptors DEC
CHEMICAL REACTIONS; ELECTRON MICROSCOPY; ELEMENTS; METALS; MICROSCOPY; SEMIMETALS; TESTING; TRANSITION ELEMENTS