Published August 1, 2000
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Thermal-Stress Effects and Enhanced Low Dose Rate Sensitivity in Linear Bipolar Ics
Description
no abstract available
Availability note (English)
Available from INIS in electronic form; Also available from OSTI as DE00760012; PURL: https://www.osti.gov/servlets/purl/760012-b5dUiL/webviewable/Files
32016790.pdf
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Additional details
Identifiers
Publishing Information
- Imprint Pagination
- 10 p.
- Report number
- SAND--2000-2001J
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 32016790
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- DOSE RATES; INTEGRATED CIRCUITS; LOW DOSE IRRADIATION; PHYSICAL RADIATION EFFECTS; SENSITIVITY; THERMAL STRESSES
- Descriptors DEC
- ELECTRONIC CIRCUITS; IRRADIATION; MICROELECTRONIC CIRCUITS; RADIATION EFFECTS; STRESSES
Optional Information
- Contract/Grant/Project number
- AC04-94AL85000
- Notes
- Submitted to IEEE Transactions on Nuclear Science
- Funding organization
- US Department of Energy (United States)