Published September 28, 2006 | Version v1
Journal article

SYNCHROTRON X-RAY BASED CHARACTERIZATION OF CDZNTE CRYSTALS

Description

Synthetic CdZnTe or 'CZT' crystals can be used for the room temperature-based detection of γ-radiation. Structural/morphological heterogeneities within CZT, such as twinning, inclusions, and polycrystallinity can affect detector performance. We used a synchrotron-based X-ray technique, specifically extended X-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission IR imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials

Availability note (English)

Also available from http://sti.srs.gov/fulltext/WSRC-MS-2006-00395.pdf

Additional details

Publishing Information

Journal Title
Journal of Electronic Materials
Journal Issue
Summer Issue
Journal Page Range
vp.
ISSN
0361-5235
CODEN
JECMA5

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
38023052
Subject category
S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ABSORPTION; DETECTION; FINE STRUCTURE; PERFORMANCE; RADIATION DETECTORS; SPECTROSCOPY; SYNCHROTRONS; TWINNING
Descriptors DEC
ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; SORPTION

Optional Information

Contract/Grant/Project number
AC09-96SR18500
Funding organization
US Department of Energy (United States)
Secondary number(s)
WSRC-MS--2006-00395