Published September 28, 2006
| Version v1
Journal article
SYNCHROTRON X-RAY BASED CHARACTERIZATION OF CDZNTE CRYSTALS
Description
Synthetic CdZnTe or 'CZT' crystals can be used for the room temperature-based detection of γ-radiation. Structural/morphological heterogeneities within CZT, such as twinning, inclusions, and polycrystallinity can affect detector performance. We used a synchrotron-based X-ray technique, specifically extended X-ray absorption fine-structure (EXAFS) spectroscopy, to determine whether there are differences on a local structural level between intact CZT of high and low radiation detector performance. These studies were complemented by data on radiation detector performance and transmission IR imaging. The EXAFS studies revealed no detectable local structural differences between the two types of CZT materials
Availability note (English)
Also available from http://sti.srs.gov/fulltext/WSRC-MS-2006-00395.pdfAdditional details
Identifiers
Publishing Information
- Journal Title
- Journal of Electronic Materials
- Journal Issue
- Summer Issue
- Journal Page Range
- vp.
- ISSN
- 0361-5235
- CODEN
- JECMA5
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 38023052
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ABSORPTION; DETECTION; FINE STRUCTURE; PERFORMANCE; RADIATION DETECTORS; SPECTROSCOPY; SYNCHROTRONS; TWINNING
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; MEASURING INSTRUMENTS; SORPTION
Optional Information
- Contract/Grant/Project number
- AC09-96SR18500
- Funding organization
- US Department of Energy (United States)
- Secondary number(s)
- WSRC-MS--2006-00395