Real-time, single-shot temporal measurements of short electron bunches, tera-hertz CSR and FEL radiation
Creators
- 1. FOM Institute Rijnhuizen / FELIX, Nieuwegein (Netherlands)
- 2. University of Abertay Dundee, School of Computing and Creative Technologies, Dundee (United Kingdom)
- 3. Dundee Univ., Div. of Electronic Engineering and Physics (United Kingdom)
Description
Electro-optic detection of the Coulomb field of electron bunches is a promising technique for single-shot measurements of the bunch length and shape in the sub-picosecond time domain. This technique has been applied to the measurement of 50 MeV electron bunches in the FELIX free electron laser, showing the longitudinal profile of single bunches of around 650 fs FWHM. The method is non-destructive and real-time, and therefore ideal for online monitoring of the longitudinal shape of single electron bunches. At FELIX we have used it for real-time optimization of sub-picosecond electron bunches. Electro-optic detection has also been used to measure the electric field profiles of far-infrared (or tera-hertz) radiation generated by the relativistic electrons. We have characterized the far-infrared output of the free electron laser, and more recently, we have measured the temporal profile of tera-hertz coherent synchrotron radiation (CSR) generated at one of the bending magnets. (authors)
Additional details
Publishing Information
- Imprint Title
- DIPAC 2005 7. European workshop on beam diagnostics and instrumentation for particle accelerators
- Imprint Pagination
- 415 p.
- Journal Page Range
- p. 151-153
- Report number
- INIS-FR--6358
Conference
- Title
- DIPAC 2005 7. European workshop on beam diagnostics and instrumentation for particle accelerators
- Dates
- 6-8 Jun 2005
- Place
- Lyon (France)
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 38074155
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM BUNCHING; BEAM MONITORING; BEAM MONITORS; BEAM OPTICS; BEAM SHAPING; ELECTRON BEAMS
- Descriptors DEC
- BEAM DYNAMICS; BEAMS; DYNAMICS; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MONITORING; MONITORS; PARTICLE BEAMS
Optional Information
- Notes
- 6 refs.