Published 1980 | Version v1
Book

New theoretical developments in electron-atom and electron-molecule processes

  • 1. Observatoire de Paris, Section de Meudon, 92 (France)

Description

The 1977-1979 developments of ab initio methods simultaneously aiming at the qualitative understanding and quantitative prediction of a wide variety of atomic and molecular processes are given. The authors describe four new developments. The variable phase method appears as a flexible tool to solve the long range coupled scattering equations producing the K-matrix by direct outward integration and if necessary the scattering solutions in compact form (variable phase amplitude method). The momentum transfer theory of angular distribution applied to scattering and photoionization processes, allows a finer analysis of the predictions and more complete comparisons with experiment. The variable phase method, combined with the frame transformation idea, provides a simplified description of scattering problems involving a large number of nearly degenerate dissociation channels such as the direct rotational (vibrational) excitation of molecules near threshold. (Auth.)

Additional details

Publishing Information

Publisher
North-Holland.
Imprint Place
Amsterdam, Netherlands
ISBN
0 444 85434 7
Imprint Title
Electronic and atomic collisions
Imprint Pagination
858 p.
Journal Page Range
p. 751-769.

Conference

Title
11. International conference on the physics of electronic and atomic collisions.
Dates
29 Aug - 4 Sep 1979.
Place
Kyoto, Japan.

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
11550028
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ELECTRON-ATOM COLLISIONS; ELECTRON-MOLECULE COLLISIONS; EXCITATION; PHOTOIONIZATION; ROTATIONAL STATES; VIBRATIONAL STATES
Descriptors DEC
ATOM COLLISIONS; COLLISIONS; ELECTRON COLLISIONS; ENERGY LEVELS; ENERGY-LEVEL TRANSITIONS; EXCITED STATES; IONIZATION; MOLECULE COLLISIONS

Optional Information

Notes
Imprint:Includes author index.