Optoelectronic properties of CuSbS2 and Cu12Sb4S13 thin films for thermoelectric applications
Creators
- 1. Universidad Autónoma de Querétaro, Querétaro (Mexico)
- 2. Escuela de Ingeniería y Ciencias, Tecnológico de Monterrey, Monterrey (Mexico)
- 3. Universidad de Guadalajara, Guadalajara (Mexico)
Description
This work presents a two-step procedure to obtain thin films with a combination of CuSbS2 and Cu12Sb4S13 phases for study in thermoelectric applications. The procedure consisted of the physical evaporation of sulfides layers (Sb2S3 and CuS) on glass substrates and the subsequent annealing of the samples in a N2 atmosphere. The characterizations by Raman spectroscopy and XRD revealed that the samples presented a varied percentage of Cu12Sb4S13 and CuSbS2 . The results indicated that the percentage of phases depended on the initial thickness of the sulfide layers and the annealing temperature. The lower initial ratio between sulfide thicknesses and annealing temperature above 300 °C favored the formation of Cu12Sb4S13. However, the thermoelectric properties were improved when the phases coexisted in the thin film compared to samples with high percentages of Cu12Sb4S13. In this way, a sample with a power factor of 2.30 μW /cm∙ K2 at 60 deg C was identified. (author)
Additional details
Publishing Information
- Journal Title
- Materials Research (Sao Carlos, Online)
- Journal Volume
- 26
- Journal Page Range
- 14 p.
- ISSN
- 1980-5373
INIS
- Country of Publication
- Brazil
- Country of Input or Organization
- Brazil
- INIS RN
- 54049638
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ANNEALING; CHALCOPYRITE; EVAPORATION; GLASS; HALL EFFECT; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SULFIDES; THERMOELECTRIC PROPERTIES; THIN FILMS; ULTRAVIOLET SPECTROMETERS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL PROPERTIES; ELECTRON MICROSCOPY; FILMS; HEAT TREATMENTS; LASER SPECTROSCOPY; MEASURING INSTRUMENTS; MICROSCOPY; MINERALS; PHASE TRANSFORMATIONS; PHYSICAL PROPERTIES; SCATTERING; SPECTROMETERS; SPECTROSCOPY; SULFIDE MINERALS; SULFUR COMPOUNDS