Photoelectron-Auger electron coincidence study for condensed matter
Creators
- 1. Department of Physics and Unita' INFM, University Roma Tre, Via della Vasca Navale 84, I-00146 Rome (Italy)
- 2. National Laboratory TASC-INFM, Area Science Park, SS 14 Km 163.5, Basovizza, I-34012 Trieste (Italy)
- 3. Department of Physics and Unita INFM, University Roma Tre, Via della Vasca Navale 84, I-00146 Rome (Italy)
- 4. IMIP-CNR Area della Ricerca di Roma, via Salaria Km 29, 3 Montelibretti (Italy)
- 5. Department of Physics and Astronomy and Laboratory of Surface Modification, Rutgers University, 136 Frelinghuysen Road, Piscataway, NJ 08855 (US)
Description
Advances in materials science have produced a wide array of new solid-state systems with tunable properties and previously unattainable combinations of phenomena that hold the promise of entirely new approaches to technological applications. Invariably, these new materials are increasingly complex and include a large number of constituents in a variety of chemical states. Entirely new theoretical and experimental approaches are needed to gain the insights necessary for intelligent engineering of these materials. In the past 20 years, a steadily increasing number of electron-electron coincidence experiments on atoms and molecules have demonstrated the capability of investigating complicated systems with sensitivity and specificity well beyond the limits imposed by conventional electron spectroscopies. Over the past decade or so, Auger-photoelectron coincidence spectroscopy (APECS) has emerged as a powerful technique for obtaining detailed information about complex materials systems. Moreover, the recent advent of angle-resolved (AR)-APECS has introduced a new level of discrimination in studying the distribution of electrons photoemitted from complex systems. In this review, we describe the basic ideas behind APECS and discuss a study of the SiO2 system as an example of the unique information this technique can provide. We then introduce the concept of AR-APECS, explain its novel state and angular momentum selectivity that can be used to disentangle information about complex systems that is hidden to conventional spectroscopies. Examples of AR-APECS measurements from Cu, Ge, and graphite that exemplify the capabilities of this technique are presented
Additional details
Identifiers
- DOI
- 10.1016/j.elspec.2004.06.005;
- PII
- S0368-2048(04)00333-0;
Publishing Information
- Journal Title
- Journal of Electron Spectroscopy and Related Phenomena
- Journal Volume
- 141
- Journal Issue
- 2-3
- Journal Page Range
- p. 149-159
- ISSN
- 0368-2048
- CODEN
- JESRAW
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36044597
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Descriptors DEI
- ANGULAR MOMENTUM; ATOMS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL STATE; COINCIDENCE SPECTROMETRY; DISTRIBUTION; ELECTRONS; GAIN; GRAPHITE; MOLECULES; PHOTOEMISSION; SENSITIVITY; SILICA; SILICON OXIDES
- Descriptors DEC
- AMPLIFICATION; CARBON; CHALCOGENIDES; COINCIDENCE METHODS; COUNTING TECHNIQUES; ELECTRON SPECTROSCOPY; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; LEPTONS; MINERALS; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; SECONDARY EMISSION; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.