Interfacial reaction of silver ultra-thin film deposited on interpenetrating polymer network substrate by liquor-phase reduction
- 1. Department of Chemistry, School of Science, Harbin Institute of Technology, Harbin 150001 (China)
- 2. College of Materials Science and Chemical Engineering, Harbin Engineering University, Harbin 150001 (China)
Description
The interfacial reaction, metal transformations, and nonmetal bond types of silver ultra-thin film deposited on polyurethane (PU) based interpenetrating polymer networks (IPN) substrate by the liquor-phase reduction at room temperatures were studied by atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS) and attenuated total reflection Fourier transform infrared spectroscopy (ATR-FTIR). The IPN substrate was prepared by dip-pulling precursors onto a silicon wafer or a glass plate, followed by solidification at room temperature. The interpenetrate structures of IPN with two crosslinked networks restricted the aggregation of silver during the reduction and deposition. The devised -OH terminal group in PU simplified the determination of reactive site in IPN and reinforced the adhesion between IPN and silver through interfacial reaction. The XPS results, which matched well with the ATR-FTIR results, verified the chemical reactive site of PU in IPN with silver in the oxide state.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2010.03.110Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2010.03.110;
- PII
- S0169-4332(10)00401-0;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 256
- Journal Issue
- 20
- Journal Page Range
- p. 6007-6012
- ISSN
- 0169-4332
- CODEN
- ASUSEE
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44018642
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ADHESION; AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CROSS-LINKING; DEPOSITION; FOURIER TRANSFORM SPECTROMETERS; GLASS; INFRARED SPECTRA; NONMETALS; OXIDES; POLYURETHANES; REFLECTION; SILICON; SILVER; SOLIDIFICATION; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRON SPECTROSCOPY; ELEMENTS; FILMS; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; PETROCHEMICALS; PETROLEUM PRODUCTS; PHASE TRANSFORMATIONS; PHOTOELECTRON SPECTROSCOPY; PLASTICS; POLYAMIDES; POLYMERIZATION; POLYMERS; SEMIMETALS; SPECTRA; SPECTROMETERS; SPECTROSCOPY; SYNTHETIC MATERIALS; TEMPERATURE RANGE; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.