Published October 20, 2012 | Version v1
Journal article

Anomalous behaviour of DSSSDs

  • 1. Ruđer Bošković Institute, Zagreb (Croatia)
  • 2. University of Zagreb - Department of physics, Zagreb (Croatia)
  • 3. Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud, Catania, Italy and University of Catania - Department of physics, Catania (Italy)
  • 4. Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud, Catania, Italy and University of Messina - Department of physics, Messina (Italy)
  • 5. Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud, Catania (Italy)
  • 6. Istituto Nazionale di Fisica Nucleare - Sez. di Padova, Padova, Italy and Istituto Nazionale di Fisica Nucleare - Laboratori Nazionali del Sud, Catania (Italy)
  • 7. Ruđer Bošković Institute, Zagreb, Croatia and Istituto Nazionale di Fisica Nucleare - Sez. di Catania, Catania (Italy)

Description

Double Sided Silicon Strip Detectors (DSSSDs) are often used in nuclear physics experiments in a wide energy range. According to the previous experiments, when a particle hits the interstrip region of these detectors, different effects may occur. Charge sharing, pulse height deficits and inverse polarity pulses on adjacent strips can influence the measured charge. In order to understand these effects and improve DSSSD utilization, an experiment was performed at the scanning proton microbeam of the Ruder Bošković Institute (RBI) using low proton microbeam intensity (∼fA) and two DSSSDs of thickness 75 μm and 998 μm.

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
1491
Journal Issue
1
Journal Page Range
p. 135-136
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
Conference on nuclear structure and dynamics 2012
Dates
9-13 Jul 2012
Place
Opatija (Croatia)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44034679
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CHARGE COLLECTION; CHARGE DISTRIBUTION; IRRADIATION; POSITION SENSITIVE DETECTORS; PROTON BEAMS; PULSES; SI MICROSTRIP DETECTORS; THICKNESS
Descriptors DEC
BEAMS; DIMENSIONS; MEASURING INSTRUMENTS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS

Optional Information

Notes
(c) 2012 American Institute of Physics