Published February 5, 2002
| Version v1
Journal article
A new readout scheme for imaging TES based on cooling time measurement
Creators
- 1. Department of Quantum Eng. and Systems Sci., University of Tokyo, Tokyo (Japan)
- 2. RACE, University of Tokyo, Tokyo (Japan)
- 3. Institute of Industrial Science, University of Tokyo, Tokyo (Japan)
- 4. National Institute of Advanced Industrial Science and Technology, Ibaraki (Japan)
Description
We are developing a tungsten transition edge sensor (W-TES) for x-ray imaging spectroscopy applications. The conventional readout scheme for TES array has a great difficulty in reading out multi-channel x-ray signals. Therefore we have considered a new readout scheme for a W-TES array. This scheme is based on a cooling time measurement in a saturation mode. In this scheme, we only need time information, therefore we can expect to simplify a readout system. Although the currently achieved energy resolution of our W-TES (0.5 mmx0.5 mm) using the cooling time measurement is 55 eV (FWHM) at 5.9 keV, much higher energy resolution is expected by making smaller devices
Additional details
Identifiers
- DOI
- 10.1063/1.1457656;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 605
- Journal Issue
- 1
- Journal Page Range
- p. 325-328
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international workshop on low temperature detectors
- Dates
- 22-27 Jul 2001
- Place
- Madison, WI (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35081607
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COOLING TIME; ENERGY RESOLUTION; KEV RANGE 01-10; MEASURING METHODS; READOUT SYSTEMS; SATURATION; SIGNALS; THIN FILMS; TUNGSTEN; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- DETECTION; ELEMENTS; ENERGY RANGE; FILMS; KEV RANGE; METALS; RADIATION DETECTION; REFRACTORY METALS; RESOLUTION; SPECTROSCOPY; TRANSITION ELEMENTS
Optional Information
- Notes
- (c) 2002 American Institute of Physics.