Published February 5, 2002 | Version v1
Journal article

A new readout scheme for imaging TES based on cooling time measurement

  • 1. Department of Quantum Eng. and Systems Sci., University of Tokyo, Tokyo (Japan)
  • 2. RACE, University of Tokyo, Tokyo (Japan)
  • 3. Institute of Industrial Science, University of Tokyo, Tokyo (Japan)
  • 4. National Institute of Advanced Industrial Science and Technology, Ibaraki (Japan)

Description

We are developing a tungsten transition edge sensor (W-TES) for x-ray imaging spectroscopy applications. The conventional readout scheme for TES array has a great difficulty in reading out multi-channel x-ray signals. Therefore we have considered a new readout scheme for a W-TES array. This scheme is based on a cooling time measurement in a saturation mode. In this scheme, we only need time information, therefore we can expect to simplify a readout system. Although the currently achieved energy resolution of our W-TES (0.5 mmx0.5 mm) using the cooling time measurement is 55 eV (FWHM) at 5.9 keV, much higher energy resolution is expected by making smaller devices

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
605
Journal Issue
1
Journal Page Range
p. 325-328
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. international workshop on low temperature detectors
Dates
22-27 Jul 2001
Place
Madison, WI (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35081607
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
COOLING TIME; ENERGY RESOLUTION; KEV RANGE 01-10; MEASURING METHODS; READOUT SYSTEMS; SATURATION; SIGNALS; THIN FILMS; TUNGSTEN; X-RAY DETECTION; X-RAY SPECTROSCOPY
Descriptors DEC
DETECTION; ELEMENTS; ENERGY RANGE; FILMS; KEV RANGE; METALS; RADIATION DETECTION; REFRACTORY METALS; RESOLUTION; SPECTROSCOPY; TRANSITION ELEMENTS

Optional Information

Notes
(c) 2002 American Institute of Physics.