Microstructure and corrosion behaviour of chromium nitride grown by dynamical ion beam mixing
Creators
- 1. Lab. of Fatigue and Fracture for Materials, Inst. of Metal Research, Academia Sinica, Shenyang (China)
Description
A chromium nitride coating on pure polycrystalline nickel was obtained by dynamical ion beam mixing (DIBM). The chemical composition and microstructure of the surface layer were examined by Auger electron spectroscopy and transmission electron microscopy, and their effects on corrosion behaviour were studied. It was found that the DIBM CrN specimen surface region consisted of amorphous Cr-N-C, Cr2(CN), Cr, CrN, Cr2N, Ni-Cr amorphous phases and a dislocation cell structure. Three-sweep potentiokinetic measurement of the specimens in de-aerated CH3COOH-CH3COONa (pH 6.7, 25degC) showed that the critical current density and minimum anodic passivating current density are lowered by two orders of magnitude for the DIBM CrN specimens. The reasons for the improvement in corrosion resistance are discussed with respect to morphology and the microstructure of DIBM CrN. (orig.)
Additional details
Publishing Information
- Journal Title
- Surface and Coatings Technology
- Journal Volume
- 51
- Journal Issue
- 1-3
- Series
- Surf. Coat. Technol.
- Journal Page Range
- 222-226
- ISSN
- 0257-8972
- CODEN
- SCTEE
Conference
- Title
- 7. international conference on surface modification of metals by ion beams.
- Dates
- 14-19 Jul 1991.
- Place
- Washington, DC (United States).
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Switzerland
- INIS RN
- 23085760
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AMORPHOUS STATE; ARGON IONS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL COMPOSITION; CHROMIUM IONS; CHROMIUM NITRIDES; CORROSION; CRITICAL CURRENT; CURRENT DENSITY; DISLOCATIONS; ELECTROCHEMISTRY; ELECTRON DIFFRACTION; ION BEAMS; ION IMPLANTATION; MICROSTRUCTURE; MIXING; MORPHOLOGY; NICKEL; NITROGEN IONS; PASSIVATION; PH VALUE; SCANNING ELECTRON MICROSCOPY; SPUTTERING; SUBSTRATES; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0273-0400 K; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; CHEMICAL REACTIONS; CHROMIUM COMPOUNDS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CURRENTS; DIFFRACTION; ELECTRIC CURRENTS; ELECTRON MICROSCOPY; ELECTRON SPECTROSCOPY; ELEMENTS; IONS; LINE DEFECTS; METALS; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; PNICTIDES; SCATTERING; SPECTROSCOPY; TEMPERATURE RANGE; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS