An interferometric microimaging system for probing laser plasmas with an X-ray laser
Creators
- 1. Laboratoire Charles Fabry--CNRS, Institut d'Optique--BP 147--91403 Orsay (France)
- 2. Laboratoire de Spectroscopie Atomique et Ionique, Universite Paris XI, 91405 Orsay (France)
- 3. CEN Bruyeres-le-Chatel, CEA/DRIF/DCRE/SDE, BP 12, 91680 Bruyeres-le-Chatel (France)
Description
The probing of dense (1021-1022 electrons/cm3) laser plasmas produced by high energy pulsed lasers usually makes use of X-ray emission imaging, or, more recently, of microradiography, i.e. of absorption imaging. However, it is well known that probing the index of refraction would bring much valuable informations. As far as index is concerned, interferometry is the choice method. However, the plasma context makes necessary to use for probing a very large brilliance, single pulse source, delivering energetic radiation, such as a soft X-ray laser. We report the design of a dedicated interferometric microimaging system, based on a Fresnel bimirror interferometer, associated with an off-axis spherical mirror, aspherized for diffraction limited (DL) imaging. In the first realization, the ideal mirror shape was approximated by a torus, making the system not diffraction limited. In a second step (currently in progress), a nearly perfect system will be realized, for diffraction limited resolution. The design and the realization techniques will be discussed and the first tests of the toroidal system will be presented
Additional details
Identifiers
- DOI
- 10.1063/1.1291201;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 507
- Journal Issue
- 1
- Journal Page Range
- p. 511-514
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 6. international conference on X-ray microscopy
- Dates
- 2-6 Aug 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 35070012
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTRA; EMISSION SPECTRA; FRESNEL LENS; INTERFEROMETERS; INTERFEROMETRY; LASER-PRODUCED PLASMA; MICRORADIOGRAPHY; MICROSCOPY; MIRRORS; REFRACTIVE INDEX; SPHERICAL CONFIGURATION; X-RAY DIFFRACTION; X-RAY LASERS; X-RAY SPECTRA
- Descriptors DEC
- COHERENT SCATTERING; CONFIGURATION; DIFFRACTION; LASERS; LENSES; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PLASMA; SCATTERING; SPECTRA
Optional Information
- Notes
- (c) 2000 American Institute of Physics.