Published 2012 | Version v1
Miscellaneous

Stability improvements of the XFEL intensity at SACLA

  • 1. RIKEN SPring-8 Center, XFEL Division, Sayo, Hyogo (Japan)

Description

For stable user operation of SACLA, an XFEL intensity is necessary to be stable within 10% RMS for a short term jitter and 10% pk-pk for long term drift. In the early stage of XFEL lasing at SACLA, however, the XFEL intensity decreased to about half of the demand, if we did not adjust the accelerator condition. The XFEL intensity is mainly affected by the peak current fluctuation and drift of an electron beam and the demanded peak current is achieved by multi-stage bunch compression system. From a simulation study, the acceleration rf phase stability for the bunch compression stage is 50 fs RMS for short term jitter and a few 100 fs pk-pk for long term drift. However, we found that the rf phase of an injector part had a large drift of 10 ps. Therefore, we improved the temperature stability of the acceleration cavity in the injector from 0.08K pk-pk to less than 0.01K pk-pk by using a further precise temperature regulation system. In addition, the temperature coefficient of low-level rf electronics was reduced. As a result, the long term XFEL intensity drift was reduced to 10% pk-pk level, if an operator sometimes finely adjusted some rf parameters of the injector. (author)

Part of:
Proceedings of the 9th annual meeting of Particle Accelerator Society of Japan

Additional details

Publishing Information

Imprint Title
Proceedings of the 9th annual meeting of Particle Accelerator Society of Japan
Imprint Pagination
[1359 p.]
Journal Page Range
[5 p.]

Conference

Title
9. annual meeting of Particle Accelerator Society of Japan
Dates
8-11 Aug 2012
Place
Toyonaka, Osaka (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
45080352
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM BUNCHING; BEAM CURRENTS; BEAM INJECTION; BEAM MONITORS; CAVITY RESONATORS; ELECTRON BEAMS; FREE ELECTRON LASERS; GEV RANGE 01-10; HZ RANGE; LINEAR ACCELERATORS; TEMPERATURE NOISE
Descriptors DEC
ACCELERATORS; BEAM DYNAMICS; BEAMS; CURRENTS; DYNAMICS; ELECTRONIC EQUIPMENT; ENERGY RANGE; EQUIPMENT; FREQUENCY RANGE; GEV RANGE; LASERS; LEPTON BEAMS; MEASURING INSTRUMENTS; MECHANICS; MONITORS; NOISE; PARTICLE BEAMS; RESONATORS

Optional Information

Notes
13 refs., 9 figs.