Published April 2, 2010 | Version v1
Journal article

Continuous hydrothermal synthesis of nickel oxide nanoplates and their use as nanoinks for p-type channel material in a bottom-gate field-effect transistor

  • 1. Advanced Device Materials Group, Advanced Electronic Materials Center, National Institute for Materials Science, 1-1 Namiki, Tsukuba, Ibaraki 305-0044 (Japan)

Description

Nickel oxide nanoplates were continuously synthesized by hydrothermal reaction using a flow-type reactor. The products had a thickness of ∼ 10 nm and a lateral size of 100-500 nm. The nanoplates were purified and drop-cast on a bottom-gate substrate and used as the channel material in a field-effect transistor after annealing at 300 deg. C. The Id-Vd profile showed that the NiO nanoplates worked as the p-type semiconductor. This result suggests that various electronic devices can be prepared using metal oxide nanomaterials, which exhibit various properties including magnetism, ferroelectronics and catalysis as well as stability and safety in air and water.

Availability note (English)

Available from http://dx.doi.org/10.1088/0957-4484/21/13/134009

Additional details

Identifiers

DOI
10.1088/0957-4484/21/13/134009;
PII
S0957-4484(10)28543-4;

Publishing Information

Journal Title
Nanotechnology (Print)
Journal Volume
21
Journal Issue
13
Journal Page Range
[4 p.]
ISSN
0957-4484

Conference

Title
Meeting on Nano and Giga Challenges in Electronic and Photonics; 14. Canadian Semiconductor Technology Conference
Acronym
NGC/CSTC2009
Dates
10-14 Aug 2009
Place
Hamilton, ON (Canada)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43022062
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ANNEALING; CATALYSIS; ELECTRONIC EQUIPMENT; FIELD EFFECT TRANSISTORS; HYDROTHERMAL SYNTHESIS; MAGNETISM; NANOSTRUCTURES; NICKEL OXIDES; SAFETY; SEMICONDUCTOR MATERIALS; SUBSTRATES; THICKNESS
Descriptors DEC
CHALCOGENIDES; DIMENSIONS; EQUIPMENT; HEAT TREATMENTS; MATERIALS; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; SEMICONDUCTOR DEVICES; SYNTHESIS; TRANSISTORS; TRANSITION ELEMENT COMPOUNDS