Published September 2017 | Version v1
Journal article

Semiclassical calculations of electron impact Stark widths and shifts of singly ionized atom lines revisited

  • 1. NASA Goddard Space Flight Center, Greenbelt, MD 20771 (United States)
  • 2. Faculty of Physics, University of Belgrade, 11001 Belgrade, P.O. Box 44 (Serbia)

Description

Highlights: • The improved semiclassical formalism in version of Griem and co-workers is reported. • Numerically improved calculations of Stark parameters at low electron plasma temperatures. • Calculations are also carried out for heavy ions, previously unreported by Griem and co-workers. - Abstract: The Stark broadening parameters for spectral lines of singly charged Mg II, Al II, Si II, Zn II, Sn II, Hg II, and Pb II ions, calculated in numerically improved semiclassical formalism of Griem are reported and compared with the original results of Griem for Mg, Al and Si ions and the semiclassical calculations in a version of Dimitrijević and Sahal-Bréchot for Mg ions. Detailed comparison with the experimental data is carried out, also.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jqsrt.2017.04.025

Additional details

Identifiers

DOI
10.1016/j.jqsrt.2017.04.025;
PII
S0022-4073(17)30207-8;

Publishing Information

Journal Title
Journal of Quantitative Spectroscopy and Radiative Transfer
Journal Volume
198
Journal Page Range
p. 9-24
ISSN
0022-4073
CODEN
JQSRAE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
49049464
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
ELECTRON TEMPERATURE; EXPERIMENTAL DATA; HEAVY IONS; ION TEMPERATURE; MAGNESIUM IONS; RADIANT HEAT TRANSFER; SEMICLASSICAL APPROXIMATION; SILICON IONS
Descriptors DEC
APPROXIMATIONS; CALCULATION METHODS; CHARGED PARTICLES; DATA; ENERGY TRANSFER; HEAT TRANSFER; INFORMATION; IONS; NUMERICAL DATA

Optional Information

Copyright
Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.