Published November 2006
| Version v1
Journal article
Formation process of microprotuberances on poly(tetrafluoroethylene) surface by synchrotron radiation exposure
- 1. Graduate School of Science, University of Hyogo, LASTI, 3-1-2 Koto, Kamigori, Ako, Hyogo 678-1205 (Japan)
Description
The formation of microprotuberances on poly(tetrafluoroethylene) (PTFE) sheet by using synchrotron radiation (SR) was investigated. The PTFE surfaces irradiated by SR were observed with scanning electron microscope. The microprotuberances were formed on the PTFE surface by SR exposure at a substrate temperature over 150 deg. C. On the other hand, they were not observed at a substrate temperature of under 120 deg. C. The formation rate of microprotuberance remarkably increased above the glass transition temperature of PTFE
Additional details
Identifiers
- DOI
- 10.1016/j.radphyschem.2005.11.023;
- PII
- S0969-806X(06)00311-2;
Publishing Information
- Journal Title
- Radiation Physics and Chemistry (1993)
- Journal Volume
- 75
- Journal Issue
- 11
- Journal Page Range
- p. 2049-2053
- ISSN
- 0969-806X
- CODEN
- RPCHDM
Conference
- Title
- 20. international conference on X-ray and inner-shell processes
- Dates
- 4-8 Jul 2005
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38040154
- Subject category
- S74: ATOMIC AND MOLECULAR PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- IRRADIATION; POLYTETRAFLUOROETHYLENE; SCANNING ELECTRON MICROSCOPY; SOFT X RADIATION; SURFACES; SYNCHROTRON RADIATION; TRANSITION TEMPERATURE
- Descriptors DEC
- BREMSSTRAHLUNG; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FLUORINATED ALIPHATIC HYDROCARBONS; HALOGENATED ALIPHATIC HYDROCARBONS; IONIZING RADIATIONS; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC FLUORINE COMPOUNDS; ORGANIC HALOGEN COMPOUNDS; ORGANIC POLYMERS; PHYSICAL PROPERTIES; POLYETHYLENES; POLYMERS; POLYOLEFINS; RADIATIONS; THERMODYNAMIC PROPERTIES; X RADIATION
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.