Design of a fast electron beam scanning system for compact synchrotron light sources
Creators
- 1. Kernforschungszentrum Karlsruhe, Institut fur Kernverfahrenstechnik, Postfach 3640, D-7500 Karlsruhe 1, Federal Republic of Germany (Germany, F.R.)
- 2. BESSY GmbH, Lentzeallee 100, D-1000 Berlin 33, Federal Republic of Germany
Description
The design of an electron beam scanning system for compact storage ring synchrotron light sources is described. The main features are a scan frequency of 100 Hz and an angular amplitude of ±5 mrad. Different configurations of scan dipoles permit confining the scan to one cell using four dipoles or to repeat the scan periodically along the whole circumference by means of two scan dipoles per cell. Combinations of these basic configurations are possible. The location of the nodes of the pivoting electron beam can be optimized with respect to the maximum scan angle by slightly unbalancing the field strength in different scan dipoles. The scan dipoles are H-shaped magnets made from laminated iron. Their gap width is 68 mm. They are powered by fast transistor-bridge supplies which are controlled by freely programmable function generators capable of realizing a triangular current waveform with a deviation of less than 0.1% except for a 1% neighborhood of the apex. Estimates of the influence of the scanning on both quantum and Coulomb lifetime indicate acceptable lifetime reductions provided the minimum distance between distorted closed orbit and aperture exceeds about six standard deviations of the spatial electron distribution
Additional details
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 60
- Journal Issue
- 7
- Series
- Rev. Sci. Instrum.
- Journal Page Range
- 1771-1774
- ISSN
- 0034-6748
- CODEN
- RSINA
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 20085524
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM ANALYZERS; BEAM MONITORING; BEAM OPTICS; BEAM PROFILES; BEAM SCANNERS; ELECTRON BEAMS; SPECIFICATIONS; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES
- Descriptors DEC
- BEAM MONITORS; BEAMS; LEPTON BEAMS; MEASURING INSTRUMENTS; MONITORING; MONITORS; PARTICLE BEAMS; RADIATION SOURCES