The preparation of difficult samples for transmission electron microscopy by ion beam thinning

Ion beam thinning methods are described and assessed for the preparation of electron transparent samples of the following materials for transmission electron microscopy: a) Face sections of HTR particle coats (PyC) and (SiC) in situ, zirconium oxide corrosion layers in situ, spalled oxide fragments, a metal coating on a steel, europia pellets, and aluminium wires. b) Cross-sections of zirconium oxide corrosion layers and a weld interface. c) Irradiated and unirradiated pellets of boron carbide. The ion beam thinning methods developed considerably shorten the time to produce specimens for transmission electron microscopy. (orig.)