Neutron-γ-ray radiography using multi-color scintillator
Creators
- 1. Musashi Inst. of Tech., Tokyo (Japan)
Description
A static image and dynamic image system for neutron-γ-ray radiography was developed by using two-color fluorescence converter developed by Toshiba. The characteristics of each system were evaluated by experiments of TNRF-2 of JRR-3M. For the static image, an elimination method of white noise depend on γ-ray and an extract method of neutron and γ-ray frame image from the red and green frame image were developed by 3CCD monocular and color camera. Two kinds of dynamic image systems, real time imaging, were developed by using a liquid crystal filter or 3CCD color camera. The good image was obtained by 3CCD color camera. 2-color fluorescence converter, the exact method of neutron image and γ-ray image, the static image pickup system and the dynamic image pickup system were stated. (S.Y.)
Additional details
Publishing Information
- Imprint Title
- Report on progress of researches by common utilization of JAERI nuclear facilities, for fiscal 2001
- Imprint Pagination
- 172 p.
- Journal Page Range
- p. 151-159
- Report number
- UTRCN-G--31
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 35020151
- Subject category
- S07: ISOTOPES AND RADIATION SOURCES;
- Resource subtype / Literary indicator
- Non-conventional Literature, Progress Report
- Descriptors DEI
- CHARGE-COUPLED DEVICES; COLOR; EUROPIUM; FLUORESCENCE; GADOLINIUM COMPOUNDS; GAMMA RADIOGRAPHY; IMAGE PROCESSING; IMAGES; INORGANIC PHOSPHORS; NEUTRON RADIOGRAPHY; OXIDES; PROGRESS REPORT; SULFUR COMPOUNDS; TERBIUM; THERMAL NEUTRONS
- Descriptors DEC
- BARYONS; CHALCOGENIDES; DOCUMENT TYPES; ELEMENTARY PARTICLES; ELEMENTS; EMISSION; FERMIONS; HADRONS; INDUSTRIAL RADIOGRAPHY; LUMINESCENCE; MATERIALS TESTING; METALS; NEUTRONS; NONDESTRUCTIVE TESTING; NUCLEONS; OPTICAL PROPERTIES; ORGANOLEPTIC PROPERTIES; OXYGEN COMPOUNDS; PHOSPHORS; PHOTON EMISSION; PHYSICAL PROPERTIES; PROCESSING; RARE EARTH COMPOUNDS; RARE EARTHS; SEMICONDUCTOR DEVICES; TESTING