Concentration characteristics of surface layer of the lead-silicate glass

The elemental composition and concentration profile of the polished surface lead-silicate glass of TF-7 type were studied by methods of Auger-spectroscopy and ellipsometry. The examination of the concentration profile permits us to make conclusions about alkalisation of glass during the polishing process. The results indicate that the narrow surface layer has a rich lead oxide which leads to an increase in its refraction index in comparison with the volume. (author)