Published December 1977
| Version v1
Journal article
Conditions for oriented crystallization of vapor deposited HgTe
Description
Conditions essential for the formation of HgTe epitaxial films on CdTe substrates and mica on precipitation from a vapour-gas phase were studied. It was demonstrated that homogeneous epitaxial layers might be obtained only in a sufficiently narrow temperature range 460-370 deg C at high cooling rates of the vapour-gas phase (approximately 30 degree/s). In order to produce the required electrical - physical parameters of the epitaxial layers, the ratio of the partial prassure of mercury to the partial pressure of tellurium in the crystallization zone should be very high (Psub(Hg)/Psub(Tesub(2)) approximately 3000)
Additional details
Additional titles
- Original title (Russian)
- Изучение условий ориентированной кристаллизации HgTe из парогазовой фазы
Publishing Information
- Journal Title
- Izv. Akad. Nauk SSSR, Neorg. Mater.
- Journal Volume
- 13
- Journal Issue
- 12
- Series
- Izv. Akad. Nauk SSSR, Neorg. Mater.
- Journal Page Range
- 2152-2156
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 9407596
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; ELECTRIC CONDUCTIVITY; EPITAXY; HIGH TEMPERATURE; MERCURY TELLURIDES; MICROSTRUCTURE; REACTION KINETICS; TEMPERATURE DEPENDENCE; VAPOR PRESSURE
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; CRYSTAL STRUCTURE; DEPOSITION; ELECTRICAL PROPERTIES; KINETICS; MERCURY COMPOUNDS; PHYSICAL PROPERTIES; SURFACE COATING; TELLURIDES; TELLURIUM COMPOUNDS; THERMODYNAMIC PROPERTIES
Optional Information
- Notes
- For English translation see the journal Inorg. Mater.