Published December 1977 | Version v1
Journal article

Conditions for oriented crystallization of vapor deposited HgTe

  • 1. Moskovskij Inst. Stali i Splavov (USSR)

Description

Conditions essential for the formation of HgTe epitaxial films on CdTe substrates and mica on precipitation from a vapour-gas phase were studied. It was demonstrated that homogeneous epitaxial layers might be obtained only in a sufficiently narrow temperature range 460-370 deg C at high cooling rates of the vapour-gas phase (approximately 30 degree/s). In order to produce the required electrical - physical parameters of the epitaxial layers, the ratio of the partial prassure of mercury to the partial pressure of tellurium in the crystallization zone should be very high (Psub(Hg)/Psub(Tesub(2)) approximately 3000)

Additional details

Additional titles

Original title (Russian)
Изучение условий ориентированной кристаллизации HgTe из парогазовой фазы

Publishing Information

Journal Title
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Volume
13
Journal Issue
12
Series
Izv. Akad. Nauk SSSR, Neorg. Mater.
Journal Page Range
2152-2156

Optional Information

Notes
For English translation see the journal Inorg. Mater.