InP Double Heterojunction Bipolar Transistor for broadband terahertz detection and imaging systems
Creators
- 1. Laboratoire Charles Coulomb (L2C), UMR 5221 CNRS-Université de Montpellier, Montpellier (France)
- 2. III-V Lab (Bell Labs, TRT and CEA/LETI joint Lab), Route de Nozay, 91460 Marcoussis (France)
- 3. Rensselaer Polytechnic Institute, Troy, New York 12180 (United States)
Description
This paper presents terahertz detectors based on high performance 0.7-μm InP double heterojunction bipolar transistor (DHBT) technology and reports on the analysis of their voltage responsivity over a wide frequency range of the incoming terahertz radiation. The detectors operated without any spatial antennas to couple terahertz radiation to the device and have been characterized in the 0.25 - 3.1 THz range with the responsivities (normalized to 1 W radiant power) of 5 V/W and 200 μV/W measured at 0.35 THz and 3.11 THz, respectively. The InP DHBTs also performed as the imaging single-pixels at room temperature in the raster scanned transmission mode. A set of the sub-terahertz images of plant leaves suggest potential utility of InP DHBT detectors for terahertz imaging dedicated to non-invasive testing of plants. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/647/1/012036Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 647
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 19. international conference on electron dynamics in semiconductors, optoelectronics and nanostructures
- Acronym
- EDISON'19
- Dates
- 29 Jun - 2 Jul 2015
- Place
- Salamanca (Spain)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47108051
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANTENNAS; ELECTRIC POTENTIAL; FIELD EFFECT TRANSISTORS; HETEROJUNCTIONS; IMAGES; INDIUM PHOSPHIDES; PERFORMANCE; TEMPERATURE RANGE 0273-0400 K; TESTING; THZ RANGE
- Descriptors DEC
- ELECTRICAL EQUIPMENT; EQUIPMENT; FREQUENCY RANGE; INDIUM COMPOUNDS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; TEMPERATURE RANGE; TRANSISTORS