Published February 2014 | Version v1
Journal article

Visualising reacting single atoms under controlled conditions: Advances in atomic resolution in situ Environmental (Scanning) Transmission Electron Microscopy (E(S)TEM)

  • 1. Department of Electronics, University of York, York Y010 5DD (United Kingdom)
  • 2. Department of Physics, University of York, York Y010 5DD (United Kingdom)
  • 3. The York JEOL Nanocentre, Department of Physics, University of York, Heslington, York, Y010 5DD (United Kingdom)
  • 4. Department of Chemistry, University of York, York Y010 5DD (United Kingdom)

Description

Advances in atomic resolution Environmental (Scanning) Transmission Electron Microscopy (E(S)TEM) for probing gas-solid catalyst reactions in situ at the atomic level under controlled reaction conditions of gas environment and temperature are described. The recent development of the ESTEM extends the capability of the ETEM by providing the direct visualisation of single atoms and the atomic structure of selected solid state heterogeneous catalysts in their working states in real-time. Atomic resolution E(S)TEM provides a deeper understanding of the dynamic atomic processes at the surface of solids and their mechanisms of operation. The benefits of atomic resolution-E(S)TEM to science and technology include new knowledge leading to improved technological processes with substantial economic benefits, improved health care, reductions in energy needs and the management of environmental waste generation. (authors)

Availability note (English)

Available from doi: <http://dx.doi.org/10.1016/j.crhy.2014.01.002

Additional details

Identifiers

Publishing Information

Journal Title
Comptes Rendus. Physique
Journal Issue
no.2-3t.15
Journal Page Range
p. 200-213
ISSN
1631-0705

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
46027469
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
REACTION KINETICS; SPATIAL RESOLUTION; SURFACES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; KINETICS; MICROSCOPY; RESOLUTION

Optional Information

Notes
45 refs.