Published September 1, 2010
| Version v1
Journal article
Pressure response to electronic structures of bulk semiconductors at room temperature
- 1. Department of Physics, Faculty of Science, Mansoura University, P.O. Box 35516, Mansoura (Egypt)
Description
We studied the effect of hydrostatic pressure (at room temperature) on the electronic band structures for Si, GaAs, and AlAs bulk semiconductors. Our calculations were based on the local empirical pseudopotential formalism. Also, the dependence of the energy gaps for Si, GaAs and AlAs semiconductors on the hydrostatic pressure were calculated. We found that the most values of the electronic energy bands were more sensitive to the pressure dependent form factor associated with the reciprocal lattice vectors of |ΔG→|2=11 than any other value. Our results for band gaps are found to be in good agreement with the available experimental data.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physb.2010.05.071Additional details
Identifiers
- DOI
- 10.1016/j.physb.2010.05.071;
- PII
- S0921-4526(10)00577-6;
Publishing Information
- Journal Title
- Physica. B, Condensed Matter
- Journal Volume
- 405
- Journal Issue
- 17
- Journal Page Range
- p. 3709-3713
- ISSN
- 0921-4526
- CODEN
- PHYBE3
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41132689
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ALUMINIUM ARSENIDES; COMPUTERIZED SIMULATION; ELECTRONIC STRUCTURE; ENERGY GAP; FERMI INTERACTIONS; FORM FACTORS; GALLIUM ARSENIDES; PRESSURE DEPENDENCE; PRESSURE RANGE GIGA PA; SEMICONDUCTOR MATERIALS; SILICON; TEMPERATURE RANGE 0273-0400 K
- Descriptors DEC
- ALUMINIUM COMPOUNDS; ARSENIC COMPOUNDS; ARSENIDES; BASIC INTERACTIONS; DIMENSIONLESS NUMBERS; ELEMENTS; GALLIUM COMPOUNDS; INTERACTIONS; MATERIALS; PARTICLE PROPERTIES; PNICTIDES; PRESSURE RANGE; SEMIMETALS; SIMULATION; TEMPERATURE RANGE; WEAK INTERACTIONS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.