Study of resolution enhancement methods for impurities quantitative analysis in uranium compounds by XRF

X-ray fluorescence analysis is a technique widely used for the determination of both major and trace elements related to interaction between the sample and radiation, allowing direct and nondestructive analysis. However, in uranium matrices these devices are inefficient because the characteristic emission lines of elements like S, Cl, Zn, Zr, Mo and other overlap characteristic emission lines of uranium. Thus, chemical procedures to separation of uranium are needed to perform this sort of analysis. In this paper the deconvolution method was used to increase spectra resolution and correct the overlaps. The methodology was tested according to NBR ISO 17025 using a set of seven certified reference materials for impurities present in U3O8 (New Brunswick Laboratory - NBL). The results showed that this methodology allows quantitative determination of impurities such as Zn, Zr, Mo and others, in uranium compounds. The detection limits were shorter than 50μg. g-1 and uncertainty was shorter than 10% for the determined elements. (author)