Published October 2016 | Version v1
Journal article

Dynamic modeling and sensitivity analysis of dAFM in the transient and steady state motions

Description

In this paper, based on the slow time varying function theory, dynamical equations for the amplitude and phase of the dynamic atomic force microscope are derived. Then, the sensitivity of the amplitude and phase to the dissipative and conservative parts of interaction force is investigated. The most advantage of this dynamical model is the ability to simulate and analysis the dynamics behavior of amplitude and phase of the AFM tip motion not only in the steady state but also in the transient regime. Using numerical analysis the transient and steady state behavior of amplitude and phase is studied and the sensitivity of amplitude and phase to the interaction force is analyzed. - Highlights: • Dynamic analysis of amplitude and phase of AFM. • Study the transient response of cantilever signal. • Sensitivity of amplitude and phase to the interaction force are analyzed.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2016.05.011

Additional details

Identifiers

DOI
10.1016/j.ultramic.2016.05.011;
PII
S0304-3991(16)30090-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
169
Journal Page Range
p. 55-61
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48085942
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
AMPLITUDES; ATOMIC FORCE MICROSCOPY; MICROSCOPES; NUMERICAL ANALYSIS; SENSITIVITY ANALYSIS; SIGNALS; SIMULATION; STEADY-STATE CONDITIONS; TRANSIENTS
Descriptors DEC
MATHEMATICS; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.