Published February 2008
| Version v1
Journal article
Selected area nanodiffraction fluctuation electron microscopy for studying structural order in amorphous solids
- 1. Department of Materials Science and Engineering, Johns Hopkins University, 3400 North Charles Street, Baltimore, MD 21218-2681 (United States)
- 2. International Frontier Center for Advanced Materials, Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai, Miyagi 980-8577 (Japan)
Description
We present a selected area nanodiffraction fluctuation electron microscopy (FEM) technique implemented on a conventional transmission electron microscope. Nanodiffraction patterns from a Pd-based metallic glass, collected using a selected area aperture 15 x 15 nm in effective size, display inhomogeneous speckling due to the small volume sampled. We compare the azimuthal intensity variance from these patterns to the spatial intensity variance from tilted dark-field measurements on the same specimens and find reasonable qualitative agreement, including features characteristic of medium-range order
Availability note (English)
Available from http://dx.doi.org/10.1016/j.scriptamat.2007.10.009Additional details
Identifiers
- DOI
- 10.1016/j.scriptamat.2007.10.009;
- PII
- S1359-6462(07)00732-4;
Publishing Information
- Journal Title
- Scripta Materialia
- Journal Volume
- 58
- Journal Issue
- 4
- Journal Page Range
- p. 303-306
- ISSN
- 1359-6462
- CODEN
- SCMAF7
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39067930
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ELECTRON DIFFRACTION; FLUCTUATIONS; METALLIC GLASSES; NANOSTRUCTURES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; SCATTERING; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.